- 扫描链
- scan: vt. (-nn-) 1.细看，细察；审视。 2.〔口语 ...
- chain: n. 1.链子，链条；项圈；表链。 2.连锁；连续，一系 ...
- boundary-scan chain: 边界扫描链
- slow scan camera chain: 慢扫描摄像机系统
- slow-scan camera chain: 慢扫描摄影电路
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scan chain中文什么意思
- 扫描链
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例句与用法
- Based on the addition algorithm , the design was optimized by the method of scan chain control and iterative invoke and realized 14 kinds of large - number operations such as addition , subtraction , multiplication , division , module addition , module multiplication , module exponential , etc
基于简单的加法操作，采用扫描链控制、迭代调用等方法对设计进行优化，实现了14种基本的大数运算功能。 - First , the low testing power dft solution - - scan array architecture are presented . in the scan array , the inserted wrapper and paralleled leaf scan chain reduce the testing power as low as the power dissipation in the normal working mode
首先，从优化测试功耗的角度出发提出了扫描阵列结构，通过加入wrapper测试控制结构以及构建并行化的分支扫描链，有效地将测试功耗降低到与正常工作功耗相当的量级。 - Chapter two detailedly presents the design of the boundary scan testing system which is in accordance with ieee . 1149 . correspondingly two special - used data registers are added , one of which is the scanning chain register and the other is the child scanning chain control - register
文中第二章按照ieee . 1149标准详细设计了边缘扫描测试系统，相应增加了两个专用数据寄存器，其中一个为扫描链寄存器，一个为扫描子链控制寄存器。 - During test , some registers in the processor are converted into scan chains to improve controllability of the circuit , the adders in the processor are used as test generators , and the produced test patterns can detect any combinational faults within every basic building cell of fft processor
测试时，该方案将处理器中的寄存器作为扫描链提高了其可控性，利用其中的加法器作为测试生成，生成的测试矢量能侦测处理器每个基本组成单元内部的任意组合失效。
百科释义
Scan chain is a technique used in Design For Test. The objective is to make testing easier by providing a simple way to set and observe every flip-flop in an IC.
详细百科解释